Submitted by admin on Fri, 12/31/2021 - 14:42

Advanced concepts including generation-recombination, hot electron effects, and breakdown mechanisms; essential features of small ac characteristics, switching and transient behavior of p-n junctions, and bipolar and MOS transistors; fundamental issues for device modeling; perspective and limitations of Si-devices.

3 undergraduate hours. 3 graduate hours. Prerequisite: ECE 340.

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