Recently, IEEE Transactions on Microwave Theory and Techniques (IEEE T-MTT), the flagship journal of the IEEE Microwave Theory and Techniques Society (MTT-S), accepted one of our latest research results, with graduate student WANG Yimin as the first author of the paper. IEEE T-MTT is recognized as the first journal in the international microwave/millimeter-wave field and is the most authoritative and influential international journal in the field of RF and microwave/millimeter wave technology, focusing on theoretical and experimental research in the field of microwave/millimeter wave devices, components, circuits, and systems.

▲ 3D structure diagram of FinFET

The authors use artificial intelligence methods to study the hot carrier injection (HCI) reliability problem of FinFET, which is of wide interest in academia and industry. In the paper, an artificial neural network (ANN) model for HCI prediction is proposed for FinFET with consideration of self-heating effect under various voltage stresses and environment temperature. The developed model is accurate as demonstrated in experimental results. The model can significantly reduce the simulation cost once the ANN model is built for the HCI prediction of FinFETs, which has great potential for reliability design in circuits and systems.

▲ Research group members WANG Yimin (left), LI Tiancheng (middle), and ZANG Wenxuan (right) discuss issues in the conference room of the ZJUI building

WANG Yimin is a graduate student of ZJUI majoring in Electronic Information in the class of 2020. Talking about the milestones achieved, he said, “Since my enrollment, I have been deeply influenced by the interdisciplinary cultivation of the institute, and my achievements cannot be separated from the inculcation and support of the institute’s cross-engineering scientific research environment.”

For professional degree graduates, ZJUI pays more attention to the unity of knowledge and action, encourages students to participate in professional practice, and improves their application and professional abilities. WANG Yimin is currently participating in related projects at Huawei, carrying out professional practice, and is committed to improving practical ability and solving important engineering problems.

▲  Wang Yimin participates in internship practice at Huawei

Corresponding authors of the paper are Dr. CHEN Wenchao and Prof. LI Erping of ZJUI. This work was supported by the Excellent Young Scholar Project of the Natural Science Foundation of China and the Key Project of the Provincial Natural Science Foundation of Zhejiang.